出展の見どころ
| SPECK SENSORSYSTEME GmbH | ||
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レーザーEXPO No. H-10 |
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| 〒D-07745 | ||||||||||||||||
| Goeschwitzer Str. 32 Jena Thuringia Germany | ||||||||||||||||
| URL：https://optosensoric.de/ | ||||||||||||||||
| ● 担当 | ||||||||||||||||
| Administration Speck Uwe | ||||||||||||||||
| TEL：+49 3641-773520 FAX： | ||||||||||||||||
| ● 出展の見どころ | ||||||||||||||||
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SPECK SENSORSYSTEME GmbH offers measurement systems and test sites for characterisation of optical materials and coatings. Our philosophy is to build easy-to-operate instruments and software solutions for highest precision technology. Our LID allows the evaluation of material absorption in the sub-ppm range in the bulk or on coated and uncoated surfaces. With our CRD you can determine losses on HR coated optics with nominal reflectivities >>99% with ppm precision. Each device and test site includes a software for the management of measurement data, offering an easily adaptable data base for inline quality control. Furthermore, SPECK SENSORSYSTEME provides industrial users with customer specific solutions for lighting and evaluation for the inline process control.
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新製品 CRD reflectiviy measurement setup Cavity-Ringdown measurement systeme for precise evaluation of losses at high-reflective coating of optical components: * Reflectivity is obtained by evalution of losses L with the assumption of R=1-L *Mesurement of losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99% (typical 99.9995% * Measurement of losses at various, discret angles of incidence and s- / p-polarization *Employed laser wavelength(s) selectable on order by user according to the desired target wavelength of coating (e.g 355nm to 1310nm) |
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新製品 LID absolute absorption measurement setup measurement system for evaluation of ultra low absorption levels in bulk material and coatings: · ultra low absorption levels in bulk material and coatings · Applicable for optical glasses (SiO2, BK7, …), optical crystals (CaF2, YVO4, LiNbO3, …), transparent synthetics (polyacrylates, etc) · Features absolute electrical power calibration, not relying on models or assumptions about the material · Features absolute electrical power calibration, not relying on models or assumptions about the material · determination of the absolute absorption coefficient α ([cm-1] for bulk material) · Sensitivity < 10μW/cm NEP(SiO2) α < 1ppm/cm |
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